nGauge AFM unit
AFM images on your benchtop in minutes
Produce high-quality topography images down to the nanoscale with the compact and versatile nGauge Atomic Force Microscope (AFM).
An integrated piezoresistive sensor in the nGauge AFM chip allows for a fully automated approach of the tip to the sample in seconds. The laserless system means that there is no laser alignment to perform - saving time during scanning and training.
Integrated, miniature X, Y and Z scanners offer unprecedented low-frequency vibration immunity and resistance to thermal drift. The electrothermal scanners are immune to creep and hysteresis effects.
nGauge AFM probes are mounted onto large printed circuit boards (PCBs) that can even be handled by hand, making exchanging the probes a breeze.
The nGauge AFM is trusted by researchers at universities, government institutes, startups and Fortune 500 companies and used by educators for teaching the next generation of students from high school to graduate school in over fifteen countries.
What's in the box?
The nGauge AFM unit includes everything you need to start imaging:
- removable sample stage
- USB to mini-USB cable
- power supply
- carrying case
- USB key with software, manual and quick start video
- 2 nGauge AFM chips
- 2 nGauge AFM test chips
Shipping within North America is $25 USD and $65 USD internationally.
Lead time is normally 4 weeks. Contact us for current lead time.
Please contact us at firstname.lastname@example.org or call us at +1 (289) 236-0204. Visit our contact page for business hours and location.
Visit the nGauge product page for more information.